Kummert, Anton - ed. ; Rafajłowicz, Ewaryst - ed.
The aim of this paper is to propose two methods of detecting defects in industrial products by an analysis of gray level images with low contrast between the defects and their background. An additional difficulty is the high nonuniformity of the background in different parts of the same image. ; The first method is based on correlating subimages with a nondefective reference subimage and searching for pixels with low correlation. To speed up calculations, correlations are replaced by a map of locally computed inner products. The second approach does not require a reference subimage and is based on estimating local entropies and searching for areas with maximum entropy. A nonparametric estimator of local entropy is also proposed, together with its realization as a bank of RBF neural networks. The performance of both methods is illustrated with an industrial image.
Zielona Góra: Uniwersytet Zielonogórski
AMCS, volume 18, number 1 (2008) ; click here to follow the link
Biblioteka Uniwersytetu Zielonogórskiego
Apr 8, 2024
Apr 4, 2024
29
https://www.zbc.uz.zgora.pl/publication/88439
Edition name | Date |
---|---|
Local correlation and entropy maps as tools for detecting defects in industrial images | Apr 8, 2024 |
Skubalska-Rafajłowicz, Ewa Rutkowska, Danuta - ed. Zadeh, Lotfi A. - ed.
Skubalska-Rafajłowicz, Ewa Korbicz, Józef (1951- ) - ed. Sauter, Dominique - ed.
Rafajłowicz, Ewaryst (1953- ) Skubalska-Rafajłowicz, Ewa Caban, Dariusz - red.
Skubalska-Rafajłowicz, Ewa Rafajłowicz, Ewaryst (1953- ) Korbicz, Józef (1951- ) - red. Uciński, Dariusz - red.
Markiewicz, Tomasz Dziekiewicz, Mirosław Maruszyński, Marek Bogusławska-Walecka, Romana Kozłowski, Wojciech Kowal, Marek - red. Korbicz, Józef (1951- ) - red.
Florea, Corneliu Florea, Laura Korbicz, Józef (1951- ) - red. Uciński, Dariusz - red.
Rafajłowicz, Ewaryst (1953- ) Wnuk, Marek Rafajłowicz, Wojciech Korbicz, Józef (1951- ) - ed. Sauter, Dominique - ed.
Nikiel, Sławomir Korbicz, Józef (1951- ) - red.