Szukana fraza: [Abstract = "The paper presents a solution of the self\-diagnostic problem of digital system by application of reconfigurable integrated circuits and boundary scan architecture. The implemented method of Built\-In Self Test \(BIST\) is non\-concurrent one and bases on the reconfiguration of the digital system, when the test mode has to be introduced. The author, with a microcontroller system as an example, shows an idea of improving the system diagnosability with minimum hardware overhead, by introducing reprogrammable gate arrays \(FPGA\) with modified functions, including adaptable BIST functions."]

Wyników: 1